Characterization of wood surface property in micro- and nano-meter scale with atomic force microscopy

Localized surface properties are important for technology development in topics like adhesion, protective coating, surface functionalization, etc. With the help of atomic force microscopy (AFM), it is not only possible to measure the true 3D surface topography in nanometer resolution, but also the localized surface forces. The aim of this project is to provide a detailed analysis on the surface properties of various components of the cellular wood structures and a deeper understanding towards the wetting behavior as well as the aging behavior of adhesive/wood interface.

Fig.1 surface topography of a cut surface of wood (spruce, latewood, radial) by AFM
Fig.2 Adhesive/wood interface imaged by AFM
Fig.3: Distribution of adhesive forces measured by –OH and –CH3 functionalized AFM tips