Equipment

Tensile and compression test

          Zwick 1474

X-ray diffraction

          Bruker D8 Advance

X-ray spectroscopy

          Bruker S4 Explorer

Scanning Electron Microscopy (SEM)

          Jeol JSM-6700F

Microscopes

     Zeiss Axioplan

     Zeiss Lichtmikroskop

Thermal analysis

     Mettler Toledo TGA/DSC 1

     Mettler Toledo DSC 1

Porosimetry

    Pascal 240 Series

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